• DocumentCode
    2130814
  • Title

    Measurement uncertainties arising from unpowered shipment of DC voltage references

  • Author

    Christian, L.A. ; Chua, S.W. ; Sim, T.Y. ; Liu, L.X.

  • Author_Institution
    Ind. Res., Measurement Standards Lab. of New Zealand, Lower Hutt, New Zealand
  • fYear
    2000
  • fDate
    14-19 May 2000
  • Firstpage
    403
  • Lastpage
    404
  • Abstract
    Continuously powering the internal temperature-controlled oven provides best accuracy with Zener-diode-based DC voltage references. The hysteresis uncertainties arising from loss of power for two Fluke 732Bs are quantified. This establishes that these instruments can be shipped without battery power between national laboratories without adding significant uncertainty to a comparison.
  • Keywords
    Zener diodes; measurement standards; measurement uncertainty; voltage measurement; DC voltage reference; Fluke 732B; Zener diode; hysteresis; measurement uncertainty; temperature controlled oven; unpowered shipment; Batteries; Humidity; Hysteresis; Instruments; Laboratories; Measurement standards; Measurement uncertainty; Productivity; Temperature; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements Digest, 2000 Conference on
  • Conference_Location
    Sydney, NSW, Australia
  • Print_ISBN
    0-7803-5744-2
  • Type

    conf

  • DOI
    10.1109/CPEM.2000.851046
  • Filename
    851046