Title :
Mining Allocating Patterns in One-Sum Weighted Items
Author :
Wang, Yanbo J. ; Zheng, Xinwei ; Coenen, Frans ; Li, Cindy Y.
Author_Institution :
Dept. of Comput. Sci., Univ. of Liverpool, Liverpool
Abstract :
An association rule (AR) is a common knowledge model in data mining that describes an implicative co-occurring relationship between two disjoint sets of binary-valued transaction database attributes (items), expressed in the form of an "antecedent rArr consequent" rule. A variant of the AR is the weighted association rule (WAR). With regard to a marketing context, this paper introduces a new knowledge model in data mining - allocating pattern (ALP). An ALP is a special form of WAR, where each rule item is associated with a weighting score between 0 and 1, and the sum of all rule item scores is 1. It can not only indicate the implicative co-occurring relationship between two (disjoint) sets of items in a weighted setting, but also inform the "allocating" relationship among rule items. ALPs can be demonstrated to be applicable in marketing and possibly a surprising variety of other areas. We further propose an apriori based algorithm to extract hidden and interesting ALPs from a "one-sum" weighted transaction database. The experimental results show the effectiveness of the proposed algorithm.
Keywords :
data mining; database management systems; set theory; transaction processing; allocation pattern mining; apriori based algorithm; binary-valued transaction database attribute; data mining; disjoint item set; implicative co-occurring relationship; knowledge model; marketing context; one-sum weighted item; weighted association rule mining; Association rules; Clustering algorithms; Computer science; Conferences; Dairy products; Data mining; Economic forecasting; Finance; Laboratories; Transaction databases; Allocating Patterns; Apriori Algorithm; Association Rule Mining; Data Mining; Weighted Association Rule Mining;
Conference_Titel :
Data Mining Workshops, 2008. ICDMW '08. IEEE International Conference on
Conference_Location :
Pisa
Print_ISBN :
978-0-7695-3503-6
Electronic_ISBN :
978-0-7695-3503-6
DOI :
10.1109/ICDMW.2008.112