• DocumentCode
    2131116
  • Title

    Robust Broadband (4 GHz - 16 GHz) GaN MMIC LNA

  • Author

    Micovic, M. ; Kurdoghlian, A. ; Lee, T. ; Hiramoto, R.O. ; Hashimoto, P. ; Schmitz, A. ; Milosavljevic, I. ; Willadsen, P.J. ; Wong, W.-S. ; Antcliffe, M. ; Wetzel, M. ; Hu, M. ; Delaney, M.J. ; Chow, D.H.

  • Author_Institution
    HRL Labs. LLC, Malibu
  • fYear
    2007
  • fDate
    14-17 Oct. 2007
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    We report robust GaN MMIC LNA operating over 4 GHz-6 GHz frequency range. An FET biased in common-drain configuration is used on the second stage of the MMIC to obtain good input return loss at the optimum noise match over the entire frequency range. The measured noise figure of the MMIC is less than 2 dB over the 4.5 GHz to 16 GHz frequency range and NF has a minimum of 1.45 dB at a frequency of 6.5 GHz. The MMIC gain is more than 10 dB and the input return loss of the MMIC is less than -10 dB over the 4 GHz-15 GHz frequency range. Reported MMIC can survive 5.4 W of incident RF power without front end protection. To the authors knowledge this is the best combination of the noise figure, input return loss, RF survivability and broadband response reported to date in this frequency range using GaN technology. The noise figure of the reported GaN MMIC is 0.5 dB lower than the overall noise figure of an equivalent GaAs pHEMT module consisting of the state of the art LNA and a 5 Watt power limiter at the front end.
  • Keywords
    III-V semiconductors; MMIC amplifiers; gallium compounds; low noise amplifiers; wide band gap semiconductors; FET; GaN; frequency 4 GHz to 16 GHz; incident RF power; noise figure; power 5.4 W; robust broadband GaN MMIC LNA; FETs; Frequency measurement; Gallium arsenide; Gallium nitride; MMICs; Noise figure; Noise measurement; Noise robustness; Protection; Radio frequency;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Compound Semiconductor Integrated Circuit Symposium, 2007. CSIC 2007. IEEE
  • Conference_Location
    Portland, OR
  • Print_ISBN
    978-1-4244-1022-4
  • Type

    conf

  • DOI
    10.1109/CSICS07.2007.54
  • Filename
    4384434