Title :
Inference in Supervised latent Dirichlet allocation
Author :
Lakshminarayanan, Balaji ; Raich, Raviv
Author_Institution :
Yandex Labs., Palo Alto, CA, USA
Abstract :
Supervised latent Dirichlet allocation (Supervised-LDA) [1] is a probabilistic topic model that can be used for classification. One of the advantages of Supervised-LDA over unsupervised LDA is that it can potentially learn topics that are inline with the class label. The variational Bayes algorithm proposed in [1] for inference in Supervised-LDA suffers from high computational complexity. To address this issue, we develop computationally efficient inference methods for Supervised-LDA. Specifically, we present collapsed variational Bayes and MAP inference for parameter estimation in Supervised-LDA. Additionally, we present computationally efficient inference methods to determine the label of unlabeled data. We provide an empirical evaluation of the classification performance and computational complexity (training as well as classification runtime) of different inference methods for the Supervised-LDA model and a classifier based on probabilistic latent semantic analysis.
Keywords :
Bayes methods; computational complexity; inference mechanisms; learning (artificial intelligence); pattern classification; probability; semantic networks; variational techniques; MAP inference; classification performance; classification runtime; collapsed variational Bayes; computational complexity; computationally efficient inference methods; parameter estimation; probabilistic latent semantic analysis; probabilistic topic model; supervised latent Dirichlet allocation; supervised-LDA; unlabeled data; unsupervised LDA; variational Bayes algorithm; Accuracy; Computational complexity; Computational modeling; Mathematical model; Nickel; Runtime; Training; Bayesian inference; Classification; Supervised Latent Dirichlet Allocation;
Conference_Titel :
Machine Learning for Signal Processing (MLSP), 2011 IEEE International Workshop on
Conference_Location :
Santander
Print_ISBN :
978-1-4577-1621-8
Electronic_ISBN :
1551-2541
DOI :
10.1109/MLSP.2011.6064562