• DocumentCode
    2131644
  • Title

    MEMS techniques for the parallel fabrication of Chip Scale Atomic Devices

  • Author

    Perez, Maximillian A. ; Knappe, Svenja ; Kitching, John

  • Author_Institution
    Atomic Devices & Instrum. Group, Nat. Inst. of Stand. & Technol. (NIST), Boulder, CO, USA
  • fYear
    2010
  • fDate
    1-4 Nov. 2010
  • Firstpage
    2155
  • Lastpage
    2158
  • Abstract
    The Atomic Devices and Instrumentation Group at NIST Boulder is working with the MEMS and Nanotechnology Exchange (MNX) to develop an Atomic MEMS process technology module for Chip Scale Atomic Devices (CSADs). Such devices are of continuing research interest as a key technology in a number of U.S. Defense Advanced Research Projects Agency (DARPA) programs and are being investigated for use in advanced frequency referencing, magnetometry and inertial sensing. The pursued module is designed to reduce development time and cost in CSAD research programs by providing a proven process to fabricate the elements commonly needed in most CSAD projects at the wafer level. The integrated platform provides thermal isolation, cell heating and electromagnetic control forming a ´smart´ package for miniature atomic vapor cells. This paper describes the design of the package made available through the MNX module. The device will able to thermally stabilize a vapor cell at 150°C with less than 5 mW of heater power. In addition, a system is currently under development at NIST Boulder designed to allow wafer-level, parallel fabrication of micromachined atomic vapor cells. The fabrication system will be suitable for use in the R&D fabrication facilities, such as those comprising the MNX network.
  • Keywords
    electromagnetism; magnetometers; micromechanical devices; nanotechnology; CSAD research programs; NIST Boulder; R&D fabrication facilities; U.S. Defense Advanced Research Projects Agency; atomic MEMS process technology module; cell heating; chip scale atomic devices; electromagnetic control; inertial sensing; instrumentation group; magnetometry; micromachined atomic vapor cells; nanotechnology exchange; parallel fabrication; thermal isolation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2010 IEEE
  • Conference_Location
    Kona, HI
  • ISSN
    1930-0395
  • Print_ISBN
    978-1-4244-8170-5
  • Electronic_ISBN
    1930-0395
  • Type

    conf

  • DOI
    10.1109/ICSENS.2010.5690546
  • Filename
    5690546