Title :
Patch-based Markov random fields for fast face occlusion recovery
Author :
Yun, Jeong Min ; Choi, Seungjin
Author_Institution :
Dept. of Comput. Sci., Pohang Univ. of Sci. & Technol., Pohang, South Korea
Abstract :
In this paper we present Markov random field (MRF) models for face occlusion detection and recovery. For occlusion detection, we use a pixel-based pair-wise MRF model (which is similar to the Ising model) where the binary mask on each pixel is inferred to decide the presence of occlusion. Then we construct a patch-based non-parametric pair-wise MRF model for occlusion recovery, which is learned using occlusion-free face images in the training set. Probabilistic inference using α-expansion leads to fast occlusion recovery, compared to the existing method. Numerical experiments confirm that our method speeds up the existing method by several orders of magnitude, while the quality of recovery is as good as the existing one.
Keywords :
Markov processes; face recognition; probability; random processes; α-expansion; binary mask; face occlusion detection; fast face occlusion recovery; occlusion-free face images; patch-based Markov random fields; pixel-based pair-wise MRF model; probabilistic inference; Computational modeling; Face; Inference algorithms; Markov processes; Mouth; Nose; Training; Face occlusion recovery; Markov random fields; probabilistic inference;
Conference_Titel :
Machine Learning for Signal Processing (MLSP), 2011 IEEE International Workshop on
Conference_Location :
Santander
Print_ISBN :
978-1-4577-1621-8
Electronic_ISBN :
1551-2541
DOI :
10.1109/MLSP.2011.6064573