• DocumentCode
    2131904
  • Title

    A W-band spectrometer for precision dielectric measurements

  • Author

    Afsar, M.N. ; Tkachov, I.I. ; Kocharyan, K.

  • Author_Institution
    Dept. of Electr. & Comput. Sci., Tufts Univ., Medford, MA, USA
  • fYear
    2000
  • fDate
    14-19 May 2000
  • Firstpage
    500
  • Lastpage
    501
  • Abstract
    A new spectrometer for the precision measurement of dielectric permittivity and loss tangent is presented. The new instrument is capable of providing the high resolution data for the first time over an extended W-band (68-118 GHz) frequencies for specimens with large range of absorption values, including highly absorbing specimens which otherwise would not be possible. A novel technique based on the unbalanced bridge is developed for the measurement of the phase of the wave passed through the specimen in free space (quasi-optical) with reference provided by a waveguide arm. Specially constructed precision waveguide and quasi-optical components allowed reliable broad band operation. A number of common dielectrics are measured and results are compared with previously reported data.
  • Keywords
    dielectric loss measurement; millimeter wave measurement; permittivity measurement; radiofrequency spectrometers; 68 to 118 GHz; EHF; W-band spectrometer; dielectric permittivity; high resolution data; highly absorbing specimens; loss tangent; phase measurement; precision dielectric measurements; precision quasi-optical component; precision waveguide components; reliable broadband operation; unbalanced bridge; waveguide arm reference; Absorption; Bridges; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Electrochemical impedance spectroscopy; Frequency; Instruments; Loss measurement; Permittivity measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements Digest, 2000 Conference on
  • Conference_Location
    Sydney, NSW, Australia
  • Print_ISBN
    0-7803-5744-2
  • Type

    conf

  • DOI
    10.1109/CPEM.2000.851102
  • Filename
    851102