Title :
The European AC QHE project: summary of the OFMET DC measurements
Author :
Jeckelmann, B. ; Rufenacht, A. ; Jeanneret, B. ; Overney, Frederic ; Pierz, K. ; von Campenhausen, A. ; Hein, G.
Author_Institution :
Swiss Fed. Inst. of Technol., Bern-Wabern, Switzerland
Abstract :
A large effort has been launched in many European national laboratories to implement the AC quantum Hall resistance as a practical quantum standard for the AC resistance. This effort is coordinated through an European project. The present paper summarizes the DC characterization made at the Swiss Federal Office of Metrology (OFMET) on several batches of samples especially fabricated at the PTB for this project.
Keywords :
electric resistance measurement; measurement standards; quantum Hall effect; AC quantum Hall resistance; DC characterization; European AC QHE project; I-V curves; OFMET DC measurements; contact resistance; precision measurements; primary standard; quantum standard; spit current contact geometry; Critical current; Current measurement; Electrical resistance measurement; Geometry; Laboratories; Measurement standards; Metrology; Performance evaluation; Temperature; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2000 Conference on
Conference_Location :
Sydney, NSW, Australia
Print_ISBN :
0-7803-5744-2
DOI :
10.1109/CPEM.2000.851111
