Title :
The analysis of benchmark circuit output surge applied in smart meters chip
Author :
Yongrui Dong ; Bin Zhang ; Hui Zhang ; Kai Zhang
Author_Institution :
Extra (Ultra) High Voltage Transm. & Transformation Branch Co., SEPC, Taiyuan, China
Abstract :
When benchmark circuit of the smart meters chip is driving large, capacitive load output becomes instability. In order to solve this problem, a new method is proposed to reduce or even eliminate the output oscillation of benchmark circuit, which is based on an equivalent model of circuit and the closed loop negative feedback circuit oscillation principle of the oscillator. This method has been validated by simulating based on Cadence software and 0.5μm CMOS technique.
Keywords :
CMOS integrated circuits; circuit feedback; feedback oscillators; integrated circuit modelling; power integrated circuits; CMOS; Cadence software; benchmark circuit output surge; closed loop negative feedback circuit oscillation principle; equivalent model; size 0.5 mum; smart meters chip; Benchmark testing; CMOS integrated circuits; Integrated circuit modeling; MOSFET circuits; Oscillators; Photonic band gap; Semiconductor device modeling; benchmark circuit; equivalent model; oscillation; smart meters;
Conference_Titel :
Consumer Electronics, Communications and Networks (CECNet), 2012 2nd International Conference on
Conference_Location :
Yichang
Print_ISBN :
978-1-4577-1414-6
DOI :
10.1109/CECNet.2012.6202197
