DocumentCode :
2132533
Title :
Spectro-tomography interpretation for integrated sensing of process component identification and distribution
Author :
Nahvi, Manoochehr ; Hoyle, Brian S.
Author_Institution :
Dept. of Electron. & Electr. Eng., Univ. of Guilan, Rasht, Iran
fYear :
2010
fDate :
1-4 Nov. 2010
Firstpage :
1309
Lastpage :
1312
Abstract :
New developments are described that augment the recently introduced electrical sensing technology of industrial process tomography (applicable to a wide range of industrial processes) with methods for the identification of materials in the contrast-sensed distribution. Advances are set in the context of current technology, where results are typically limited intrinsically by single frequency excitation. Previous extensions to the platform technology have provided a spectroscopic dimension, using wideband excitation and associated detection technique, to deliver a raw spectro-tomogram dataset. Two methods and test results are described which add the capability to interpret this raw dataset to identify process components: a simply implemented look-up table (LUT) method able to identify known and distinct ´spectral fingerprints´; and a more computationally intensive model-fitting method that can tolerate components that are similar in their spectrographic response.
Keywords :
electric impedance imaging; image reconstruction; signal processing; tomography; contrast sensed distribution; electrical sensing technology; industrial process tomography; integrated sensing; intensive model fitting method; look up table method; process component identification; spectral fingerprints; spectrotomography interpretation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Sensors, 2010 IEEE
Conference_Location :
Kona, HI
ISSN :
1930-0395
Print_ISBN :
978-1-4244-8170-5
Electronic_ISBN :
1930-0395
Type :
conf
DOI :
10.1109/ICSENS.2010.5690578
Filename :
5690578
Link To Document :
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