DocumentCode
2133001
Title
Study of single electron transistor for metrological application
Author
Iwasa, A. ; Fukushima, A. ; Sato, A. ; Sakamoto, Y. ; Endo, T.
Author_Institution
Electrotech. Lab., Tsukuba, Japan
fYear
2000
fDate
14-19 May 2000
Firstpage
593
Lastpage
594
Abstract
SET transistor was fabricated in ETL for meteorological application. Gate modulation for a single electron transistor was observed. TLF-type noise was also observed which depend on cooling time.
Keywords
semiconductor device noise; single electron transistors; TLF noise; cooling time; gate modulation; metrological applications; single electron transistor; Aluminum; Capacitance; Capacitors; Electrodes; Laboratories; Meteorology; Refrigeration; Scanning probe microscopy; Single electron transistors; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements Digest, 2000 Conference on
Conference_Location
Sydney, NSW, Australia
Print_ISBN
0-7803-5744-2
Type
conf
DOI
10.1109/CPEM.2000.851149
Filename
851149
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