Title :
Ultra low temperature behaviour of a cryogenic vacuum gap capacitor
Author :
Teunissen, P. ; Dierikx, E. ; Rietveld, G.
Author_Institution :
NMi Van Swinden Lab., Delft, Netherlands
Abstract :
A vacuum gap capacitor for operation at millikelvin temperatures has been designed, fabricated and tested. Below 500 mK the capacitance value exhibits a relative temperature dependence (dC/dT)C/sup -1/ that is smaller than 10/sup -9//mK. The long term relative stability is better than 5/spl middot/10/sup -6//day.
Keywords :
capacitive sensors; capacitors; charge measurement; cryogenics; electric current measurement; stability; capacitance temperature dependence; cryogenic vacuum gap capacitor; long term relative stability; millikelvin temperature operation; sensor; ultra low temperature behaviour; Bridge circuits; Capacitance measurement; Capacitors; Coaxial cables; Cryogenics; Electrodes; Insulation; Springs; Temperature; Testing;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2000 Conference on
Conference_Location :
Sydney, NSW, Australia
Print_ISBN :
0-7803-5744-2
DOI :
10.1109/CPEM.2000.851151
