DocumentCode
2133035
Title
Ultra low temperature behaviour of a cryogenic vacuum gap capacitor
Author
Teunissen, P. ; Dierikx, E. ; Rietveld, G.
Author_Institution
NMi Van Swinden Lab., Delft, Netherlands
fYear
2000
fDate
14-19 May 2000
Firstpage
597
Lastpage
598
Abstract
A vacuum gap capacitor for operation at millikelvin temperatures has been designed, fabricated and tested. Below 500 mK the capacitance value exhibits a relative temperature dependence (dC/dT)C/sup -1/ that is smaller than 10/sup -9//mK. The long term relative stability is better than 5/spl middot/10/sup -6//day.
Keywords
capacitive sensors; capacitors; charge measurement; cryogenics; electric current measurement; stability; capacitance temperature dependence; cryogenic vacuum gap capacitor; long term relative stability; millikelvin temperature operation; sensor; ultra low temperature behaviour; Bridge circuits; Capacitance measurement; Capacitors; Coaxial cables; Cryogenics; Electrodes; Insulation; Springs; Temperature; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements Digest, 2000 Conference on
Conference_Location
Sydney, NSW, Australia
Print_ISBN
0-7803-5744-2
Type
conf
DOI
10.1109/CPEM.2000.851151
Filename
851151
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