• DocumentCode
    2133116
  • Title

    The statistical inversion algorithm of bare surface soil moisture for the AMSR using C-band IEM simulated emissivity

  • Author

    Zhang, Lixin ; Shi, Jiancheng ; Liu, Suhong ; Zhao, Kaiguang

  • Author_Institution
    Dept. Geogr., Beijing Normal Univ., China
  • Volume
    5
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    3079
  • Abstract
    Based on the bistatic scattering theory a simulated database of bare soil surface emissivity with dual polarization is found for the configuration of AMSR using the Integral Equation Method (IEM). Parameters including soil moisture, correlation length and RMS height are mainly considered to evaluate the signature of the bare soil surface emissivity. Analysis has been done to investigate the relationship between the emissivity and the parameters. The results show that the influence of soil surface moisture and roughness parameters on the emissivity is quite complex. It is difficult to separate the coupled influence of the moisture and roughness factors through only statistical processing. An algorithm for estimation of soil surface moisture with AMSR at C-band is developed based on the method to extract a pair of functions corresponding to vertical and horizontal polarization and depending only on dielectric constant and incident angle. There is a good linear relation between the combinations of the extracted functions and the dual polarized emissivity. Hence, if we obtain the measurements of the dual polarized emissivity of a pixel the soil surface moisture can be estimated from the dielectric constant calculated from the statistical relations.
  • Keywords
    microwave measurement; radiometry; soil; terrain mapping; AMSR; Advanced Microwave Scanning Radiometer; C-band IEM simulated emissivity; Integral Equation Method; RMS height; bare soil surface emissivity; bare surface soil moisture; bistatic scattering theory; correlation length; dielectric constant; dual polarization; horizontal polarization; incident angle; soil roughness parameters; statistical inversion algorithm; statistical processing; vertical polarization; Databases; Dielectric constant; Dielectric measurements; Integral equations; Polarization; Rough surfaces; Scattering; Soil moisture; Surface roughness; Surface soil;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium, 2002. IGARSS '02. 2002 IEEE International
  • Print_ISBN
    0-7803-7536-X
  • Type

    conf

  • DOI
    10.1109/IGARSS.2002.1026875
  • Filename
    1026875