DocumentCode :
2133458
Title :
Using MCD-DVS For Dynamic Thermal Management Performance Improvement
Author :
Chaparro, Pedro ; Magklis, Grigorios ; González, José ; González, Antonio
Author_Institution :
Intel Barcelona Res. Center, Intel Labs-UPC, Barcelona
fYear :
2006
fDate :
May 30 2006-June 2 2006
Firstpage :
140
Lastpage :
146
Abstract :
With chip temperature being a major hurdle in microprocessor design, techniques to recover the performance loss due to thermal emergency mechanisms are crucial in order to sustain performance growth. Many techniques for power reduction in the past and some on thermal management more recently have contributed to alleviate this problem. Probably the most important thermal control technique is dynamic voltage and frequency scaling (DVS) which allows for almost cubic reduction in power with worst-case performance penalty only linear. So far, DVS techniques for temperature control have been studied at the chip level. Finer grain DVS is feasible if a globally-asynchronous locally-synchronous (GALS) design style is employed. GALS, also known as multiple-clock domain (MCD), allows for an independent voltage and frequency control for each one of the clock domains that are part of the chip. There are several studies on DVS for GALS that aim to improve energy and power efficiency but not temperature. This paper proposes and analyses the usage of DVS at the domain level to control temperature in a clustered MCD microarchitecture with the goal of improving the performance of applications that do not meet the thermal constraints imposed by the designers
Keywords :
cooling; microprocessor chips; temperature control; thermal management (packaging); chip temperature; dynamic voltage scaling; globally-asynchronous locally-synchronous design; microprocessor design; multiple-clock domain; thermal constraints; thermal control; thermal emergency mechanisms; thermal management; Clocks; Disaster management; Dynamic voltage scaling; Energy management; Frequency control; Microprocessors; Performance loss; Temperature control; Thermal management; Voltage control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronics Systems, 2006. ITHERM '06. The Tenth Intersociety Conference on
Conference_Location :
San Diego, CA
ISSN :
1087-9870
Print_ISBN :
0-7803-9524-7
Type :
conf
DOI :
10.1109/ITHERM.2006.1645334
Filename :
1645334
Link To Document :
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