Title :
An error-locating signature analyzer to identify faulty units in digital systems
Author :
Geurkov, Vadim ; Dynkin, Vladimir ; Sedaghat, Reza
Author_Institution :
Electr. & Comput. Eng. Dept., Ryerson Univ., Toronto, ON
Abstract :
In conventional signature analysis, faulty units are identified by mismatch between the actual and reference signatures. The amount of reference signatures can be quite large for a complex system that requires high testing resolution. This complicates the diagnosis procedure. We show how under certain restrictions this amount can be reduced, preserving the diagnosis resolution and the aliasing rate. We construct a signature analyzer that is capable of locating faulty units. If the analyzer is implemented in the external automated test equipment, its throughput requirements can be diminished.
Keywords :
automatic test equipment; built-in self test; error correction codes; signal processing equipment; built-in self-test; complex system; diagnosis procedure; error-locating signature analyzer; high testing resolution; reference signatures; Circuit faults; Computer errors; Digital systems; Error analysis; Error correction; Fault detection; Fault diagnosis; Hardware; Redundancy; System testing; Built-in self-test; error-control codes; signature analysis; test data compression;
Conference_Titel :
Electrical and Computer Engineering, 2008. CCECE 2008. Canadian Conference on
Conference_Location :
Niagara Falls, ON
Print_ISBN :
978-1-4244-1642-4
Electronic_ISBN :
0840-7789
DOI :
10.1109/CCECE.2008.4564702