• DocumentCode
    2133590
  • Title

    Fast multi-class sample reduction for speeding up support vector machines

  • Author

    Chen, Jingnian ; Liu, Cheng-Lin

  • Author_Institution
    Nat. Lab. of Pattern Recognition, Beijing, China
  • fYear
    2011
  • fDate
    18-21 Sept. 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Despite the superior classification performance of support vector machines (SVMs), training SVMs on large datasets is still a challenging problem. Sample reduction methods have been proposed and shown to reduce the training complexity significantly, but more or less trade off the generalization performance. This paper presents an efficient sample reduction method for multi-class classification using one-vs-rest SVMs, called Multi-class Sample Selection (MUSS). For each binary one-vs-rest classification problem, positive samples and negative samples are selected based on the distances from the cluster centers of positive class, assuming that positive samples with large distances from the positive centers and negative samples with small distances from the positive centers are near the classification boundary. The intention of clustering is to improve the computation efficiency of sample selection, other than to select from cluster centers as previous methods did. Experiments on a wide variety of datasets demonstrate the superiority of the proposed MUSS over other competitive algorithms in respect of the tradeoff between reduced sample size and classification performance. The experimental results show that MUSS also works well for binary classification problems.
  • Keywords
    generalisation (artificial intelligence); pattern classification; pattern clustering; support vector machines; binary one-vs-rest classification problem; cluster centers; competitive algorithms; fast multiclass sample reduction methods; multiclass classification; multiclass sample selection; support vector machines; training complexity; Accuracy; Algorithm design and analysis; Clustering algorithms; Complexity theory; Glass; Support vector machines; Training; Clustering; Multi-class classification; SVM; Sample selection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Machine Learning for Signal Processing (MLSP), 2011 IEEE International Workshop on
  • Conference_Location
    Santander
  • ISSN
    1551-2541
  • Print_ISBN
    978-1-4577-1621-8
  • Electronic_ISBN
    1551-2541
  • Type

    conf

  • DOI
    10.1109/MLSP.2011.6064636
  • Filename
    6064636