Title :
Optimization of average precision with Maximal Figure-of-Merit Learning
Author :
Kim, Ilseo ; Lee, Chin-Hui
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
We propose an efficient algorithm to directly optimize class average precision (AP) with a Maximal Figure-of-Merit (MFoM) learning scheme. AP is considered as a staircase function with respect to each individual sample score after rank ordering is applied to all samples. A combination of sigmoid functions is then used to approximate AP as a continuously differentiable function of the classified parameters used to compute the sample scores. Compared to pair-wise ranking comparisons, the computational complexity of the proposed MFoM-AP learning algorithm can be substantially reduced when estimating classifier parameters with a gradient descent algorithm. Experiments on the TRECVID 2005 high-level feature extraction task showed that the proposed algorithm can effectively improve the mean average precision (MAP) over 39 concepts from a baseline performance of 0.4039 with MFoM maximizing F1 to 0.4274 with MFoM-AP, while showing significant impromvements for 12 concepts as more than 10%.
Keywords :
computational complexity; feature extraction; function approximation; gradient methods; learning (artificial intelligence); optimisation; pattern classification; MFoM-AP learning algorithm; average precision optimization; computational complexity; gradient descent algorithm; high-level feature extraction; maximal figure-of-merit learning scheme; mean average precision; pair-wise ranking comparisons; sigmoid functions; staircase function; Approximation algorithms; Approximation methods; Computational modeling; Manganese; Measurement; Optimization; Training; MFoM; automatic image annotation; average precision; high-level image feature extraction; optimization; rank statistics;
Conference_Titel :
Machine Learning for Signal Processing (MLSP), 2011 IEEE International Workshop on
Conference_Location :
Santander
Print_ISBN :
978-1-4577-1621-8
Electronic_ISBN :
1551-2541
DOI :
10.1109/MLSP.2011.6064638