DocumentCode :
2133865
Title :
Poor confinement of e-h recombination zone in blue oleds
Author :
Sadek, Tarek ; Aziz, Hany ; Loutfy, Rafik O. ; Smith, Peter M.
Author_Institution :
Dept. of Electr. & Comput. Eng., McMaster Univ., Hamilton, ON
fYear :
2008
fDate :
4-7 May 2008
Abstract :
The possibility of making large light-emitting area with low cost has stimulated the research work on organic-based light-emitting devices (OLEDs). OLEDs with emission color covering almost the entire visible range have been realized. This was achieved by simultaneously synthesizing new materials and optimizing the device structure itself by adding/getting rid of different layers. Recently, OLEDs performance has improved and has become adequate for many display applications. However, the main problem still to be solved, concerns the short lifetime of the devices. Surprisingly, there are only few fundamental works on the degradation mechanisms of OLEDs. The mechanisms behind the light decay and the color shifts, especially for blue colour, are still not fully understood. Earlier studies have suggested that the poor balance between the number of electrons and holes in the emitting layer, is one of the main factors in limiting the lifetime of the device.
Keywords :
organic light emitting diodes; blue OLED; degradation mechanisms; device structure; e-h recombination zone; organic-based light-emitting devices; Anodes; Cathodes; Charge carrier processes; Current measurement; Electron emission; Glass; Indium tin oxide; Organic light emitting diodes; P-i-n diodes; Spontaneous emission; Blue OLEDs; Recombination zone; aging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical and Computer Engineering, 2008. CCECE 2008. Canadian Conference on
Conference_Location :
Niagara Falls, ON
ISSN :
0840-7789
Print_ISBN :
978-1-4244-1642-4
Electronic_ISBN :
0840-7789
Type :
conf
DOI :
10.1109/CCECE.2008.4564711
Filename :
4564711
Link To Document :
بازگشت