Title :
Using the Allan variance and power spectral density to characterize dc nanovoltmeters
Author_Institution :
Bur. Int. des Poids et Mesures, Sevres, France
Abstract :
Stochastic serial correlations in nanovoltmeter data are often ignored and the experimental standard deviation divided by the square root of the number of observations is incorrectly used to describe the scatter. This paper demonstrates the use of power spectra and the Allan variance to characterize the performance of digital and analog DC nanovoltmeters.
Keywords :
correlation methods; data analysis; measurement standards; measurement uncertainty; spectral analysis; stochastic systems; voltage measurement; voltmeters; Allan variance; analog DC nanovoltmeters; digital DC nanovoltmeters; experimental standard deviation; power spectra; power spectral density; scatter; square root; stochastic serial correlation; Analysis of variance; Filters; Measurement standards; Metrology; Noise measurement; Scattering; Stochastic processes; Time measurement; Voltage measurement; White noise;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2000 Conference on
Conference_Location :
Sydney, NSW, Australia
Print_ISBN :
0-7803-5744-2
DOI :
10.1109/CPEM.2000.851188