DocumentCode :
2133867
Title :
Using the Allan variance and power spectral density to characterize dc nanovoltmeters
Author :
Witt, T.J.
Author_Institution :
Bur. Int. des Poids et Mesures, Sevres, France
fYear :
2000
fDate :
14-19 May 2000
Firstpage :
667
Lastpage :
668
Abstract :
Stochastic serial correlations in nanovoltmeter data are often ignored and the experimental standard deviation divided by the square root of the number of observations is incorrectly used to describe the scatter. This paper demonstrates the use of power spectra and the Allan variance to characterize the performance of digital and analog DC nanovoltmeters.
Keywords :
correlation methods; data analysis; measurement standards; measurement uncertainty; spectral analysis; stochastic systems; voltage measurement; voltmeters; Allan variance; analog DC nanovoltmeters; digital DC nanovoltmeters; experimental standard deviation; power spectra; power spectral density; scatter; square root; stochastic serial correlation; Analysis of variance; Filters; Measurement standards; Metrology; Noise measurement; Scattering; Stochastic processes; Time measurement; Voltage measurement; White noise;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2000 Conference on
Conference_Location :
Sydney, NSW, Australia
Print_ISBN :
0-7803-5744-2
Type :
conf
DOI :
10.1109/CPEM.2000.851188
Filename :
851188
Link To Document :
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