• DocumentCode
    2134030
  • Title

    A timed Petri Net model for the IEEE 802.15.4 CSMA-CA process

  • Author

    Shuaib, A. Haffiz ; Mahmoodi, Toktam ; Aghvami, A. Hamid

  • Author_Institution
    Center for Telecommun. Res., King´´s Coll. London, London, UK
  • fYear
    2009
  • fDate
    13-16 Sept. 2009
  • Firstpage
    1204
  • Lastpage
    1210
  • Abstract
    The IEEE 802.15.4 specification has generated a lot of interest in recent times, especially within the Wireless Sensor Network (WSN) research community, primarily because energy efficiency is one of the specifications´ design cornerstone. As this specification is relatively new, it is incumbent that its operational mechanisms are well understood, to allow for efficient cross layer interactions between the different processes that make up the specification and existing or new higher layer protocols. In this paper, we present a deterministic Petri-Net model of the IEEE 802.15.4 CSMA-CA process, that is timer driven and operates within the bounds of the contention access period (CAP). Using this model, we are able to analyze the performance characteristics of the CSMA-CA process, especially in terms of channel throughput and energy consumption. We also verify the extracted system indices by comparing them to those gotten from a full model of the specification, implemented using the OPNET network simulation platform.
  • Keywords
    Petri nets; carrier sense multiple access; simulation; wireless sensor networks; CSMA-CA process; IEEE 802.15.4 specification; OPNET network simulation platform; contention access period; timed Petri net model; wireless sensor network; Analytical models; Bismuth; Bit rate; Cross layer design; Educational institutions; Equations; IP networks; Routing protocols; Wireless application protocol; Wireless sensor networks; CSMA-CA; IEEE 802.15.4; Modelling; Petri-Net; Wireless Sensor Networks;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Personal, Indoor and Mobile Radio Communications, 2009 IEEE 20th International Symposium on
  • Conference_Location
    Tokyo
  • Print_ISBN
    978-1-4244-5122-7
  • Electronic_ISBN
    978-1-4244-5123-4
  • Type

    conf

  • DOI
    10.1109/PIMRC.2009.5450095
  • Filename
    5450095