• DocumentCode
    2134382
  • Title

    Configurable Active-Region-Cutout-Transistor for radiation hardened circuit applications

  • Author

    Binzaid, Shuza ; Attia, John O.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Prairie View A&M Univ., Prairie View, TX
  • fYear
    2008
  • fDate
    4-7 May 2008
  • Abstract
    Active-region-cutout (ARC) technique was developed to modify transistorpsilas active region in order to overcome shorted source-drain in an enclosed poly MOS device. The gate poly extension was made through the unipotential electrode of the active region of drain. This new transistor is named as active-region-cutout-transistor (ARCT). The latter transistor is known to be very tolerant to total ionization dose radiation. ARC technique has an advantage of making MOSFETs with more than three terminals. The ARC can be used to make a compound MOSFET. Two types of amplifier circuits have been studied by replacing transistors with compound ARCTs.
  • Keywords
    MOSFET; amplifiers; radiation hardening (electronics); MOSFET; amplifier circuits; configurable active-region-cutout-transistor; gate poly extension; ionization dose radiation; poly MOS device; radiation hardened circuit applications; shorted source-drain; unipotential electrode; Application software; Electric potential; Electrodes; Ionization; Ionizing radiation; Leakage current; MOS devices; MOSFET circuits; Radiation effects; Radiation hardening;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical and Computer Engineering, 2008. CCECE 2008. Canadian Conference on
  • Conference_Location
    Niagara Falls, ON
  • ISSN
    0840-7789
  • Print_ISBN
    978-1-4244-1642-4
  • Electronic_ISBN
    0840-7789
  • Type

    conf

  • DOI
    10.1109/CCECE.2008.4564732
  • Filename
    4564732