DocumentCode :
2134382
Title :
Configurable Active-Region-Cutout-Transistor for radiation hardened circuit applications
Author :
Binzaid, Shuza ; Attia, John O.
Author_Institution :
Dept. of Electr. & Comput. Eng., Prairie View A&M Univ., Prairie View, TX
fYear :
2008
fDate :
4-7 May 2008
Abstract :
Active-region-cutout (ARC) technique was developed to modify transistorpsilas active region in order to overcome shorted source-drain in an enclosed poly MOS device. The gate poly extension was made through the unipotential electrode of the active region of drain. This new transistor is named as active-region-cutout-transistor (ARCT). The latter transistor is known to be very tolerant to total ionization dose radiation. ARC technique has an advantage of making MOSFETs with more than three terminals. The ARC can be used to make a compound MOSFET. Two types of amplifier circuits have been studied by replacing transistors with compound ARCTs.
Keywords :
MOSFET; amplifiers; radiation hardening (electronics); MOSFET; amplifier circuits; configurable active-region-cutout-transistor; gate poly extension; ionization dose radiation; poly MOS device; radiation hardened circuit applications; shorted source-drain; unipotential electrode; Application software; Electric potential; Electrodes; Ionization; Ionizing radiation; Leakage current; MOS devices; MOSFET circuits; Radiation effects; Radiation hardening;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical and Computer Engineering, 2008. CCECE 2008. Canadian Conference on
Conference_Location :
Niagara Falls, ON
ISSN :
0840-7789
Print_ISBN :
978-1-4244-1642-4
Electronic_ISBN :
0840-7789
Type :
conf
DOI :
10.1109/CCECE.2008.4564732
Filename :
4564732
Link To Document :
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