Title :
Short-wave infrared nano-injection imaging sensors
Author :
Memis, Omer Gokalp ; Kohoutek, John ; Wu, Wei ; Gelfand, Ryan M. ; Mohseni, Hooman
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Northwestern Univ., Evanston, IL, USA
Abstract :
A novel nano-injection based imaging sensor is presented towards demanding applications in telecommunications, biophotonics, optical tomography, explosives detection and non-destructive material evaluation. The sensor can provide low noise levels concurrently with strong internal amplification, which results in a significant increase in the signal-to-noise levels compared to existing short-wave infrared imagers. The imager arrays are 320-by-256 pixels, with a pixel pitch of 30 μm. Post-hybridization, the imager test pixels shows internal amplification exceeding 2,000 electrons/photon with little excess noise (F~1.5) even at high amplification values. The imager shows a high signal to noise ratio at high frame rates and short integration times. Furthermore, the nano-injection imaging sensor shows significant sensitivity improvement over a high-end commercial short-wave infrared camera at similar settings, which highlights the benefits of implementing nano injection process in imaging sensors.
Keywords :
bio-optics; cameras; explosives; image sensors; infrared imaging; optical tomography; biophotonics; explosives detection; imager test pixels; internal amplification; nanoinjection imaging sensors; nondestructive material; optical tomography; short wave infrared imaging sensors; short-wave infrared camera; telecommunications;
Conference_Titel :
Sensors, 2010 IEEE
Conference_Location :
Kona, HI
Print_ISBN :
978-1-4244-8170-5
Electronic_ISBN :
1930-0395
DOI :
10.1109/ICSENS.2010.5690666