DocumentCode
2135483
Title
Effect of applied bias voltage on the static and dynamic characteristics of self-pulsating multi-section InGaN-based laser diode
Author
Sulmoni, L. ; Lamy, J.-M. ; Carlin, J. -F ; Zeng, X. ; Boïko, D.L. ; Grandjean, N.
Author_Institution
ICMP, Ecole Polytech. Fed. de Lausanne (EPFL), Lausanne, Switzerland
fYear
2012
fDate
7-10 Oct. 2012
Firstpage
114
Lastpage
115
Abstract
InGaN-based laser diodes (LDs) are suitable for obtaining low-cost and compact short-pulse laser light sources in the blue-violet range exploiting either mode-locking or self-pulsating regimes. Typically these devices consist of a Fabry-Perot-type cavity with separate electrical p-contacts to define multiple sections: a short reverse-biased section that acts as a saturable absorber (SA) and a long forward-biased gain section. Recently we demonstrated 18 ps duration optical pulses under the self-pulsation regime on InGaN multi-section blue LDs at repetition rate of several GHz [1]. The development of this new kind of ultrafast sources would be of great interest for applications such as next generation large-capacity optical storage, ultraprecise nano-processing and biomedical imaging [2].
Keywords
Fabry-Perot resonators; III-V semiconductors; electrical contacts; gallium compounds; indium compounds; laser cavity resonators; laser mode locking; optical pulse generation; semiconductor diodes; semiconductor lasers; wide band gap semiconductors; Fabry-Perot-type cavity; InGaN; applied bias voltage effect; biomedical imaging; blue-violet range; dynamic characteristics; electrical p-contacts; large-capacity optical storage; long-forward-biased gain section; low-cost-compact short-pulse laser light sources; mode locking; optical pulses; saturable absorber; self-pulsating multisection laser diode; short-reverse-biased section; static characteristics; ultrafast sources; ultraprecise nanoprocessing; Absorption; Diode lasers; Laser mode locking; Optical pulses; Power generation; Semiconductor lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Laser Conference (ISLC), 2012 23rd IEEE International
Conference_Location
San Diego, CA
ISSN
0899-9406
Print_ISBN
978-1-4577-0828-2
Type
conf
DOI
10.1109/ISLC.2012.6348355
Filename
6348355
Link To Document