DocumentCode :
2136351
Title :
FPG-Grow: A Graph Based Pattern Grow Algorithm for Application Level IO Pattern Mining
Author :
Zhang Jing-Liang ; Zhang Jun-wei ; Xu Lu
Author_Institution :
Inst. of Comput. Technol., Chinese Acad. of Sci., Beijing, China
fYear :
2010
fDate :
15-17 July 2010
Firstpage :
311
Lastpage :
316
Abstract :
The previous study of pattern discovery in storage systems focus on sequential pattern (SP) mining in lower level traces, but they don´t scale well to the application level. For patterns in application level are mostly composed of Contiguous Item Sequential Patterns (CISP) which are much simpler than SP, so it´s inefficient for the previous studies to mine CISP with clumsy SP mining algorithms. We propose a novel algorithm FPG-Grow which is more preferable for mining application level IO patterns. The FPG-Grow only scan the origin sequence in one-pass to construct a Frequent Pattern Graph (FPG), from which we can easily extract the CISPs by fetching the frequent sub-graphs with linear cost. Also we can do the verification efficiently by avoiding the origin sequence scan. Furthermore, the grow method will eliminate the information loss introduced by sequence cutting as C-Miner does. The experiment result shows that the FPG-Grow outperforms C-Miner prominently in mining with real application IO traces and the simulation result also proves the effectiveness of CISP in application IO optimizations.
Keywords :
data mining; graph theory; optimisation; C-Miner; FPG-Grow; IO optimizations; contiguous item sequential patterns; frequent pattern graph; graph based pattern grow algorithm; level IO pattern mining; pattern discovery; storage systems; Algorithm design and analysis; Computers; Correlation; Data mining; Optimization; Search problems; Testing; C-Miner; CISP; Clospan; FPG; KCL(Kirchhoff´s Current Law); SP;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Networking, Architecture and Storage (NAS), 2010 IEEE Fifth International Conference on
Conference_Location :
Macau
Print_ISBN :
978-1-4244-8133-0
Type :
conf
DOI :
10.1109/NAS.2010.23
Filename :
5575676
Link To Document :
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