Title :
An experimental study of degradation of anisotropic conductive adhesive joints
Author :
Lin, Y.C. ; Chen, Xu ; Wang, Z.P.
Author_Institution :
Sch. of Mech. & Electr. Eng., Central South Univ., Changsha
fDate :
May 30 2006-June 2 2006
Abstract :
The epoxy-based anisotropic conductive film (ACF) joints have the potential of being exposed to a hygrothermal environment and susceptible to moisture sorption. The long-term hygrothermal aging will induce the irreversible damages of epoxy resins system due to susceptibility of the polymer to hydrolysis, oxidation, etc. In this study, the hygrothermal environment test (85degC/85%RH) was used as an accelerator for the degradation of ACF joints in chip-on-glass (COG) assemblies. The effects of hydrothermal aging on the epoxy-based ACF joints were analyzed by Fourier transform infrared spectroscopy (FTIR) and scanning electron microscope (SEM). Results show that the changes of molecular conformations for the aged ACF have been found, and the fracture mechanisms of ACF joints have been gradually changed with the hygrothermal aging
Keywords :
Fourier transform spectroscopy; adhesive bonding; adhesives; ageing; conducting polymers; elasticity; fatigue; infrared spectroscopy; materials testing; scanning electron microscopy; thermal stress cracking; wafer bonding; ACF joint; COG assembly; FTIR; Fourier transform infrared spectroscopy; SEM; anisotropic conductive adhesive; chip-on-glass; epoxy-based anisotropic conductive film; hydrothermal aging; hygrothermal aging; hygrothermal environment test; joint degradation; moisture sorption; scanning electron microscope; Aging; Anisotropic conductive films; Anisotropic magnetoresistance; Conductive adhesives; Degradation; Epoxy resins; Moisture; Oxidation; Polymers; Scanning electron microscopy;
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronics Systems, 2006. ITHERM '06. The Tenth Intersociety Conference on
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-9524-7
DOI :
10.1109/ITHERM.2006.1645448