Title :
Field Overlay Architecture for Manufacturing Systems
Author :
Ohno, Takeshi ; Kataoka, Akira ; Noguchi, Akira
Author_Institution :
Yokogawa Electr. Corp., Tokyo
Abstract :
Efforts to effectively utilize field data in a wider area continue in the Held of manufacturing systems today. As part of these efforts, we focus on a computing environment for field devices, in which functionality can be flexibly expanded to effectively utilize data. However, there are several issues to be solved when new functionality is added to programs on various devices and multiple users operate the system concurrently. To solve these issues, we propose a computing environment for field devices called Field Overlay Architecture (FOA). The FOA provides a Common Computing Environment to be embedded on every device and an Overlay Management Framework for application environments. By the FOA, multiple users can operate their own applications on devices concurrently and independently. This paper describes the concept and mechanism of the FOA and a prototyped system based on the FOA.
Keywords :
IP networks; manufacturing systems; IP network; computing environment; field overlay architecture; manufacturing system; overlay management framework; prototyped system; Collaboration; Communication system control; Computer architecture; Manufacturing systems; Planning; Production systems; Prototypes; Service oriented architecture; Trademarks; Transportation;
Conference_Titel :
Industrial Informatics, 2007 5th IEEE International Conference on
Conference_Location :
Vienna
Print_ISBN :
978-1-4244-0851-1
Electronic_ISBN :
1935-4576
DOI :
10.1109/INDIN.2007.4384884