DocumentCode :
21368
Title :
Superlens-Based Nanoscale Imaging
Author :
Mandal, Srimanta
Author_Institution :
Central Mech. Eng. Res. Inst., Durgapur, India
Volume :
33
Issue :
2
fYear :
2014
fDate :
March-April 2014
Firstpage :
17
Lastpage :
20
Abstract :
Since the discovery of the superlens (a lens that uses metamaterials to go beyond the diffraction limit), optical imaging for nanometer-sized objects has become possible. A superlens basically aids in the resolution improvement of an image, which is the primary essence to observe subwavelength features (in the nanometer range). The subwavelength features are missed in conventional optical imaging systems due to the diffraction limit of light. In the 21st century, various methods have been proposed to conduct nano-imaging using superlenses. This article provides a basic insight of nano-imaging using superlenses, various problems and limitations in nanovision, and the latest improvements in research.
Keywords :
image resolution; lenses; light diffraction; optical images; optical metamaterials; diffraction limit; image resolution; metamaterial; nanometer-sized object; nanovision; optical imaging system; superlens-based nanoscale imaging; Image resolution; Lenses; Nanoscale devices; Optical diffraction; Optical imaging; Optical surface waves;
fLanguage :
English
Journal_Title :
Potentials, IEEE
Publisher :
ieee
ISSN :
0278-6648
Type :
jour
DOI :
10.1109/MPOT.2013.2282165
Filename :
6757046
Link To Document :
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