• DocumentCode
    2136864
  • Title

    Isothermal cyclic bend fatigue test method for lead free solder joints

  • Author

    Pang, John H L ; Che, Fa-Xing

  • Author_Institution
    Sch. of Mech. & Aerosp. Eng., Nanyang Technol. Univ., Singapore
  • fYear
    2006
  • fDate
    May 30 2006-June 2 2006
  • Firstpage
    1011
  • Lastpage
    1017
  • Abstract
    Isothermal three-point and four-point cyclic bend fatigue test method have been developed for Sn-Ag-Cu solder joints. Reported bend tests from the literature were conducted at room temperature (25degC) and there is lack of data for lead-free solder joints. In this study, VQFN assembly with Sn-Ag-Cu lead-free solder was tested under three-point and four-point cyclic bending load at room temperature (25degC) and high temperature (125degC). Two different board side surface finishes including Ni/Au and OSP were investigated. One daisy chain loop containing all 48 solder joints was designed for in-situ measurement of resistance and solder joint failure detection. Fatigue resistance of VQFN with OSP finish is slightly better than Ni/Au case. The fatigue failure behavior at high temperature (125degC) to room temperature (25degC) is compared. FEA modeling and simulation were performed for different testing conditions to investigate the stress strain behavior of solder joint. Volume-averaged energy density accumulation is used as a fatigue damage parameter. Energy-based fatigue models were developed for Sn-Ag-Cu lead free solder subjected to cyclic bending load at 25degC and 125degC
  • Keywords
    bending; copper alloys; failure (mechanical); failure analysis; fatigue testing; gold; nickel; silver alloys; solders; tin alloys; 125 C; 25 C; FEA modeling; Ni-Au; OSP; Sn-Ag-Cu; VQFN assembly; board side surface finish; cyclic bending load; in-situ resistance measurement; isothermal cyclic bend fatigue test; lead free solder joint; solder joint failure detection; stress strain behavior; Assembly; Environmentally friendly manufacturing techniques; Fatigue; Gold; Isothermal processes; Lead; Soldering; Surface finishing; Temperature; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Thermomechanical Phenomena in Electronics Systems, 2006. ITHERM '06. The Tenth Intersociety Conference on
  • Conference_Location
    San Diego, CA
  • ISSN
    1087-9870
  • Print_ISBN
    0-7803-9524-7
  • Type

    conf

  • DOI
    10.1109/ITHERM.2006.1645455
  • Filename
    1645455