Title :
A FE-study of solder fatigue compared to microstructural damage evaluation by in-SITU laser scanning and FIB microscopy
Author :
Dudek, Rainer ; Faust, Wolfgang ; Gollhard, Astrid ; Michel, Bernd
Author_Institution :
Fraunhofer-Inst. fur Zuverlassigkeit und Mikrointegration, Micro Mater. Center, Berlin
fDate :
May 30 2006-June 2 2006
Abstract :
A combined numerical-testing methodology was developed for microscopic in-situ observation of fatigue failure of small material volumes thermo-mechanically loaded in shear, which was applied to Sn95.5Ag3.8Cu0.7 (SAC) solder. Different temperature cyclic environments were investigated: test cycles of -40degC to 125degC and field cycles of 0degC to 80 degC. Fatigue testing was accompanied by FE-modeling. For all cycles the FE-analyses revealed a non-constant shear strain distribution, which showed local maxima at the interface edges between solder and pads and a region of relatively constant amplitudes at the central part of the joints. By laser scanning microscopy the local deformation behavior and the fatigue progress could be visualized. Microcracking along strain incompatibilities, e.g. small angle grain boundaries, was the preferred mechanism of damage initiation. From comparisons with FE simulations of the tests it became obvious that this damage path usually coincides with the regions where the local maximum creep strains are calculated. However, it was also observed that inhomogeneities, e.g. intermetallic platelets or voids, are additional preferred locations for damage initiation, which are usually not considered in FEA. Locations of strain incompatibility appeared particularly critical for test cycle loading. Focused ion etching and related FIB microscopy allowed insight in further localized microstructural degradation processes down to the nanoscale. Failure prediction is finally compared to the failures observed for both cyclic regimes
Keywords :
creep fracture; failure (mechanical); failure analysis; focused ion beam technology; ion microscopy; metallography; reliability; scanning probe microscopy; solders; thermal stress cracking; -40 to 125 C; 0 to 80 C; FE-study; FIB microscopy; SAC solder; SnAgCu; fatigue failure; focused ion etching; in-situ laser scanning; intermetallic platelets; lap-shear test; laser scanning microscopy; microcracking; microstructural damage evaluation; microstructural degradation; numerical-testing methodology; shear strain distribution; solder fatigue; temperature cyclic environment; thermo-mechanical fatigue; voids; Capacitive sensors; Fatigue; Grain boundaries; Iron; Microscopy; Optical materials; Temperature; Testing; Thermomechanical processes; Visualization;
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronics Systems, 2006. ITHERM '06. The Tenth Intersociety Conference on
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-9524-7
DOI :
10.1109/ITHERM.2006.1645458