Computation of radian pressure forces on micron-size objects using a new "localized vector" method

Absorption, reflection or refraction of light by a dielectric material results in small forces, typically of the order of piconewtons. These forces due to "radiation pressure", although small when compared to mechanical forces, can be used to exert a high degree of control over micron-size objects in MEMS devices. Existing models for the estimation of radiation pressure forces are based on the "ray tracing" approach. In this paper, a new "localized vector" approach for the estimation of radiation pressure forces is presented. The new approach was found to be more efficient in terms of code length, computation time and formulation of geometry as compared to the "ray tracing" approach.