• DocumentCode
    2137617
  • Title

    A thermal conductivity model for micro-nanoscale diamond thin films using dispersion curve data

  • Author

    Kalisik, Todd ; Majumdar, Pradip

  • Author_Institution
    Dept. of Mech. Eng., Northern Illinois Univ., DeKalb, IL
  • fYear
    2006
  • fDate
    May 30 2006-June 2 2006
  • Firstpage
    1199
  • Lastpage
    1207
  • Abstract
    Thermal conductivity is investigated for cubic C (diamond). Boundary scattering, Umklapp processes, normal processes and presence of impurities are the mechanisms considered for heat flow resistance. Three symmetry directions [001], [110], [111], and three polarizations for each direction in the first Brillouin zone are considered for the material. The main purpose of this study is to analyze the effect of the curvature of phonon dispersion curves on the thermal conductivity, and develop an accurate model. The model incorporates the effects of impurity and impurity concentration, film thickness, and crystal orientation on thermal conductivity. The model is validated by comparing results with experimental data for diamond. The results show that the curvature of the dispersion curves dramatically affects the thermal conductivity. A sensitivity analysis is conducted to study the effect of boundary scattering as the film decreases in thickness and the effect of impurities
  • Keywords
    Brillouin zones; crystal orientation; diamond; heat transfer; impurity absorption spectra; nanostructured materials; phonon-impurity interactions; sensitivity analysis; thermal conductivity; thin films; umklapp process; Brillouin zone; Umklapp processes; [001] symmetry; [110] symmetry; [111] symmetry; boundary scattering; crystal orientation; curvature effect; diamond thin films; dispersion curve data; film thickness; heat flow resistance; impurity concentration; impurity effect; normal processes; phonon dispersion curves; sensitivity analysis; thermal conductivity model; Brillouin scattering; Conducting materials; Conductive films; Crystalline materials; Impurities; Phonons; Polarization; Resistance heating; Thermal conductivity; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Thermomechanical Phenomena in Electronics Systems, 2006. ITHERM '06. The Tenth Intersociety Conference on
  • Conference_Location
    San Diego, CA
  • ISSN
    1087-9870
  • Print_ISBN
    0-7803-9524-7
  • Type

    conf

  • DOI
    10.1109/ITHERM.2006.1645481
  • Filename
    1645481