Title :
A nonlinear fracture mechanics prespective on solder joint failure: going beyond the coffin-manson equation
Author :
Bhate, D. ; Subbarayan, Ganesh
Author_Institution :
Sch. of Mech. Eng., Purdue Univ., West Lafayette, IN
fDate :
May 30 2006-June 2 2006
Abstract :
Predicting the fatigue life of solder interconnections is a challenge due to the complex nonlinear behavior of solder alloys and the load history. Long experience with Sn-Pb solder alloys together with empirical fatigue life models such as the Coffin-Manson rule have helped us identify reliable choices among package design alternatives. However, for the currently popular Pb-free choice of SnAgCu solder joints, designing accelerated thermal cycling tests and estimating the fatigue life are challenged by the significantly different creep behavior relative to Sn-Pb alloys. In this paper, a hybrid fatigue modeling approach inspired by nonlinear fracture mechanics is developed to predict the crack trajectory and fatigue life of a solder interconnection subjected to both isothermal accelerated thermal and anisothermal power cycling conditions. The model is shown to be similar to well accepted cohesive zone models in its approach and application and is anticipated to be computationally more efficient in a finite element setting. The approach goes beyond empirical modeling in accurately predicting crack trajectories. It is argued that such non-empirical models that capture the physics of material degradation and failure can form the basis for determining meaningful Pb-free solder environmental testing conditions as well as the acceleration factors relative to field use
Keywords :
creep fracture; electronics packaging; failure analysis; fracture mechanics; life testing; solders; Coffin-Manson equation; SnAgCu; accelerated thermal cycling tests; anisothermal power cycling; cohesive zone models; crack trajectory; creep behavior; fatigue life prediction; hybrid fatigue modeling; isothermal power cycling; lead-free solder; material degradation; material failure; nonempirical models; nonlinear fracture mechanics; solder interconnections; solder joint failure; Creep; Fatigue; History; Life estimation; Life testing; Nonlinear equations; Packaging; Predictive models; Soldering; Trajectory;
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronics Systems, 2006. ITHERM '06. The Tenth Intersociety Conference on
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-9524-7
DOI :
10.1109/ITHERM.2006.1645484