Size effect in micro and nano structures

Author

Liu, Wenjun ; Sadeghipour, Sadegh M. ; Asheghi, Mehdi

Author_Institution

Dept. of Aerosp. & Mech. Eng., Notre Dame Univ., IN

fYear

2006

fDate

May 30 2006-June 2 2006

Firstpage

1292

Lastpage

1298

Abstract

This paper presents an analytical model for the size effect in rectangular cross-section metal wires based on a solution to the Boltzmann transport equation (BTE). The results are verified with the solution at the limiting cases of thin film and square cross section wire with various specular reflection coefficients at the film boundaries and agree well. In addition, a simple model was developed that can be conveniently used to approximate the exact solution of the BTE. These results can be used for the predictions of the electrical resistance and/or thermal conductivity of the metal as well as semiconductor nanostructures

Keywords

Boltzmann equation; boundary-value problems; electrical resistivity; nanowires; semiconductor thin films; thermal conductivity; Boltzmann transport equation; analytical model; electrical resistance; reduction function; semiconductor nanostructures; size effect; thermal conductivity; Analytical models; Boltzmann equation; Electric resistance; Optical films; Reflection; Semiconductor films; Thermal conductivity; Thermal resistance; Transistors; Wires;

fLanguage

English

Publisher

ieee

Conference_Titel

Thermal and Thermomechanical Phenomena in Electronics Systems, 2006. ITHERM '06. The Tenth Intersociety Conference on

Conference_Location

San Diego, CA

ISSN

1087-9870

Print_ISBN

0-7803-9524-7

Type

conf

DOI

10.1109/ITHERM.2006.1645494

Filename

1645494