DocumentCode :
2137975
Title :
A CMOS-MEMS Inertial Measurement Unit
Author :
Alandry, B. ; Latorre, L. ; Mailly, F. ; Nouet, P.
Author_Institution :
Microelectron. Dept., Univ. Montpellier 2, Montpellier, France
fYear :
2010
fDate :
1-4 Nov. 2010
Firstpage :
1033
Lastpage :
1036
Abstract :
This paper introduces the first monolithic integration of a 3-axis accelerometer, a 2-axis magnetometer and a full custom front-end electronics. This complete Inertial Measurement Unit (IMU) has been designed on a single die of 7.5 mm2 in a 0.35μm CMOS technology. The five electro mechanical sensors are batch-manufactured using a single-step wet etching of the CMOS die. Compared to existing Inertial Measurement Units, assembly costs and common issues associated with sensor misalignments are suppressed. Sensors make use of resistive transduction, either mechanically or thermally induced. The on-chip electronic has been designed to cancel parasitic effects such as offset and to optimize the signal to-noise ratio on each measurement axis. The achieved performance (8-bits on Earth magnetic field measurement, 8 bits and 6-bits on x/y and z gravity acceleration respectively) makes the device suitable for numerous applications in consumer electronics.
Keywords :
CMOS integrated circuits; accelerometers; etching; magnetometers; micromechanical devices; microsensors; system-on-chip; units (measurement); CMOS-MEMS inertial measurement unit; IMU; axis accelerometer; axis magnetometer; electro-mechanical sensor; full-custom front-end electronics; monolithic integration; resistive transduction; sensor misalignment; single-step wet etching; size 0.35 mum;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Sensors, 2010 IEEE
Conference_Location :
Kona, HI
ISSN :
1930-0395
Print_ISBN :
978-1-4244-8170-5
Electronic_ISBN :
1930-0395
Type :
conf
DOI :
10.1109/ICSENS.2010.5690799
Filename :
5690799
Link To Document :
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