• DocumentCode
    2137975
  • Title

    A CMOS-MEMS Inertial Measurement Unit

  • Author

    Alandry, B. ; Latorre, L. ; Mailly, F. ; Nouet, P.

  • Author_Institution
    Microelectron. Dept., Univ. Montpellier 2, Montpellier, France
  • fYear
    2010
  • fDate
    1-4 Nov. 2010
  • Firstpage
    1033
  • Lastpage
    1036
  • Abstract
    This paper introduces the first monolithic integration of a 3-axis accelerometer, a 2-axis magnetometer and a full custom front-end electronics. This complete Inertial Measurement Unit (IMU) has been designed on a single die of 7.5 mm2 in a 0.35μm CMOS technology. The five electro mechanical sensors are batch-manufactured using a single-step wet etching of the CMOS die. Compared to existing Inertial Measurement Units, assembly costs and common issues associated with sensor misalignments are suppressed. Sensors make use of resistive transduction, either mechanically or thermally induced. The on-chip electronic has been designed to cancel parasitic effects such as offset and to optimize the signal to-noise ratio on each measurement axis. The achieved performance (8-bits on Earth magnetic field measurement, 8 bits and 6-bits on x/y and z gravity acceleration respectively) makes the device suitable for numerous applications in consumer electronics.
  • Keywords
    CMOS integrated circuits; accelerometers; etching; magnetometers; micromechanical devices; microsensors; system-on-chip; units (measurement); CMOS-MEMS inertial measurement unit; IMU; axis accelerometer; axis magnetometer; electro-mechanical sensor; full-custom front-end electronics; monolithic integration; resistive transduction; sensor misalignment; single-step wet etching; size 0.35 mum;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2010 IEEE
  • Conference_Location
    Kona, HI
  • ISSN
    1930-0395
  • Print_ISBN
    978-1-4244-8170-5
  • Electronic_ISBN
    1930-0395
  • Type

    conf

  • DOI
    10.1109/ICSENS.2010.5690799
  • Filename
    5690799