DocumentCode :
2138079
Title :
Temperature and bias effects in high resistivity silicon substrates
Author :
Reyes, A.C. ; El-Ghazaly, S.M. ; Dorn, S. ; Dydyk, M.
Author_Institution :
Motorola Inc., Tempe, AZ, USA
Volume :
1
fYear :
1996
fDate :
17-21 June 1996
Firstpage :
87
Abstract :
The purpose of this paper is to report the results of studies dealing with the impact of temperature and DC bias on low-cost low loss high resistivity (HR) Si substrate. Measured results show that microwave performance of a coplanar transmission lines and a meander inductive structure realized on HR Si are not affected by applied DC bias from -10 V to 10 V in the temperature range from -50/spl deg/C to 50/spl deg/C. Furthermore, measured results demonstrate that the losses of the structures under study on HR Si are comparable to the losses of similar structures on semi-insulating (SI) GaAs up to 100/spl deg/C.
Keywords :
coplanar waveguides; elemental semiconductors; losses; microwave integrated circuits; silicon; -10 to 10 V; -50 to 50 degC; DC bias; Si; bias effects; coplanar transmission lines; high resistivity substrates; losses; meander inductive structure; microwave performance; Conductivity; Coplanar waveguides; Dielectric loss measurement; Dielectric measurements; Frequency; Gallium arsenide; Loss measurement; Probes; Silicon; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 1996., IEEE MTT-S International
Conference_Location :
San Francisco, CA, USA
ISSN :
0149-645X
Print_ISBN :
0-7803-3246-6
Type :
conf
DOI :
10.1109/MWSYM.1996.508469
Filename :
508469
Link To Document :
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