Title :
A NLTL-Based Integrated Circuit for a 70-200 GHz VNA System
Author :
Wohigemuth, O. ; Agarwal, B. ; Pullela, R. ; Mensa, D. ; Lee, Q. ; Guthrie, J. ; Rodwell, M.J.W. ; Reuter, R. ; Braunstein, J. ; Schlechtweg, M. ; Krems, T. ; Kohler, Klaus
Author_Institution :
Fraunhofer Institute for Applied Solid State Physics (IAF), Tullastr. 72, D-79108 Freiburg, Germany, Phone: +49 761/5159-538, Fax: +49 761/5159-565, Email: olwo@iaf.fhg.de
Abstract :
We present an integrated circuit, based on nonlinear transmission lines (NLTL), for network analysis within 70-200 GHz. This is the first integrated circuit containing all elements of a S-Parameter test set: A multiplier to generate the RF signal, couplers to separate the incident and reflected waves, and a pair of high speed sampling circuits for down-converting the signals to lower frequencies.
Keywords :
Circuit testing; Couplers; Distributed parameter circuits; High speed integrated circuits; Integrated circuit testing; RF signals; Radiofrequency integrated circuits; Sampling methods; Scattering parameters; Signal generators;
Conference_Titel :
Microwave Conference, 1998. 28th European
Conference_Location :
Amsterdam, Netherlands
DOI :
10.1109/EUMA.1998.338100
