Title :
Large signal S-parameters
Author_Institution :
HRL Labs., Malibu, CA, USA
Abstract :
This paper presents generalization of scattering parameters to nonlinear circuits, overviews their applications and discusses their limitations. Those limitations were not a problem as long as the devices under test were matched at all ports. However the software tools that allow arbitrary settings can be easily misused.
Keywords :
S-parameters; nonlinear network analysis; devices under test; large signal S-parameters; nonlinear circuits; scattering parameters; software tools; Application software; Broadband communication; Circuit testing; Laboratories; Microwave communication; Microwave oscillators; Nonlinear circuits; Scattering parameters; Software tools; Steady-state;
Conference_Titel :
ARFTG Conference, 2006 67th
Conference_Location :
San Francisco, CA
Print_ISBN :
978-0-7803-9529-9
DOI :
10.1109/ARFTG.2006.4734341
