DocumentCode :
2138853
Title :
Investigation of MMIC flip chips with sealants for improved reliability without hermeticity
Author :
Sturdivant, R. ; Quan, C. ; Wooldridge, J.
Author_Institution :
Radar & Commun. Syst., Hughes Aircraft Co., El Segundo, CA, USA
Volume :
1
fYear :
1996
fDate :
17-21 June 1996
Firstpage :
239
Abstract :
As a result of the advantages they offer, MMIC flip chips are being developed for airborne radar applications. Some of the benefits of this technology are lower wafer processing cost when Coplanar Waveguide (CPW) is used as the transmission line, surface mount compatibility, repeatable low inductance interconnect, self-alignment due to solder surface tension, very high reliability, and robust 25 mil thick chips. These benefits result in lower manufacturing cost at the chip and module level, higher quality, and increased reliability. A series of recent experiments indicate that this technology may also allow for the use of sealants which provide chip protection at a fraction of the cost of welding or seam sealing at the module level. We have investigated the use of flip chips with sealants and show measured results for GaAs MMIC flip chips operating in the 5-15 GHz range which use sealants for environmental protection.
Keywords :
MMIC; coplanar waveguides; environmental testing; flip-chip devices; integrated circuit packaging; integrated circuit reliability; seals (stoppers); 25 mil; 5 to 15 GHz; CPW; GaAs; MMIC flip chips; airborne radar applications; chip protection; coplanar waveguide; environmental protection; glob top; low inductance interconnect; manufacturing cost; module level; reliability; sealants; sealguard; self alignment; solder surface tension; surface mount compatibility; Airborne radar; Coplanar transmission lines; Coplanar waveguides; Costs; Flip chip; MMICs; Protection; Sealing materials; Surface waves; Surface-mount technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 1996., IEEE MTT-S International
Conference_Location :
San Francisco, CA, USA
ISSN :
0149-645X
Print_ISBN :
0-7803-3246-6
Type :
conf
DOI :
10.1109/MWSYM.1996.508502
Filename :
508502
Link To Document :
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