Title :
An improved multiline TRL method
Author :
Zúñiga-Juárez, J.E. ; Reynoso-Hernández, J.A. ; Maya-Sánchez, M.C.
Author_Institution :
Div. de Fis. Aplic., Depto. Electron. y Telecomun., Centro de Investig. Cientifica y de Educ. Super. de Ensenada (CICESE), Ensenada, Mexico
Abstract :
This paper presents a multiline TRL (Thru-Reflect Line) method that is based on a straightforward de-embedding method and a reliable method for determining a each frequency the value of a/c, b, and e-¿1 terms. The main features of the proposed multiline TRL are: a) The transmission line propagation constant is not used, therefore the physical lengths of the lines are not needed, and b) The Gauss-Markov method is used only to estimate the best values of the constants a/c and b. The S parameters of an offset short, an offset open, and a load, measured in the frequency range of 1-50 GHz, corrected with the multiline TRL method from NIST and the multiline TRL method from CICESE agree each other.
Keywords :
Gaussian processes; Markov processes; S-parameters; microwave measurement; network analysers; Gauss-Markov method; NIST; S parameters measurement; deembedding method; error correction methods; frequency 1 GHz to 50 GHz; multiline TRL method; network analyzer; thru-reflect line method; Calibration; Coaxial components; Error correction; Frequency measurement; Gaussian processes; NIST; Propagation constant; Scattering parameters; Telecommunications; Transmission line measurements; De-embedding; Multiline TRL; Straight de-embedding method; wave propagation constant;
Conference_Titel :
ARFTG Conference, 2006 67th
Conference_Location :
San Francisco, CA
Print_ISBN :
978-0-7803-9529-9
DOI :
10.1109/ARFTG.2006.4734363
