DocumentCode :
2138959
Title :
An enhanced Line-Reflect-Reflect-Match calibration
Author :
Hayden, Leonard
Author_Institution :
Cascade Microtech, Inc., Beaverton, OR, USA
fYear :
2006
fDate :
16-16 June 2006
Firstpage :
143
Lastpage :
149
Abstract :
This paper reports the results of a detailed study of a commercial implementation of the Line-Reflect-Reflect Match (LRRM) vector network analyzer calibration method with automatic load inductance correction. Limitations in applicability for non-offset standards and when the Line (Thru) standard is electrically long and/or the load inductive reactance is large are examined. An enhanced LRRM (eLRRM) algorithm has been developed providing superior and more predictable results for these less frequently encountered cases. eLRRM is available in a commercial VNA calibration software product.
Keywords :
calibration; inductance; measurement standards; network analysers; VNA calibration software product; automatic load inductance correction; enhanced line-reflect-reflect-match calibration; load inductive reactance; nonoffset standards; vector network analyzer calibration method; Calibration; Electric variables measurement; Frequency measurement; Horses; Impedance; Inductance; Measurement standards; Probes; Software algorithms; USA Councils; Calibration; LRM; LRRM; Probe; VNA; Vector Network Analyzer;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ARFTG Conference, 2006 67th
Conference_Location :
San Francisco, CA
Print_ISBN :
978-0-7803-9529-9
Type :
conf
DOI :
10.1109/ARFTG.2006.4734364
Filename :
4734364
Link To Document :
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