Title :
Modern approach for estimating uncertainty of a precision optoelectronic phase noise measurement
Author :
Salzenstein, Patrice ; Pavlyuchenko, Ekaterina
Author_Institution :
Franche Comte Electron. Mec. Thermique, Opt. Sci. et Technol., Besancon, France
Abstract :
Modern approach according to recent standards is used to determine uncertainty on phase noise for an optoelectronic measurement system. Deduced global uncertainty on the spectral density of phase noise is 1.6 dB.
Keywords :
integrated optoelectronics; measurement standards; measurement uncertainty; noise measurement; optical variables measurement; phase measurement; global uncertainty; measurement standards; measurement uncertainty; precision optoelectronic phase noise measurement; spectral density; Measurement uncertainty; Noise measurement; Optical resonators; Phase measurement; Phase noise; Uncertainty;
Conference_Titel :
Advanced Optoelectronics and Lasers (CAOL), 2013 International Conference on
Conference_Location :
Sudak
Print_ISBN :
978-1-4799-0016-9
DOI :
10.1109/CAOL.2013.6657629
