DocumentCode :
2139174
Title :
Micro impact characterisation of solder joint for drop impact application
Author :
Wong, E.H. ; Mai, Y.-W. ; Rajoo, R. ; Tsai, K.T. ; Liu, F. ; Seah, S.K.W. ; Yeh, C.-L.
Author_Institution :
Inst. of Microelectron., Singapore
fYear :
0
fDate :
0-0 0
Abstract :
Good correlation has been established between high speed shearing of solder joint at component level and board level drop tests, endorsing high speed shearing as a viable quality assurance test for manufacturing and incoming inspection. The high speed shear characteristics of solder joints under different test conditions (shear speed, shear angle, and temperature) and aging conditions (multiple reflow, temperature humidity, and salt spray) have been evaluated. Preliminary S-N characteristic for SnPb_OSP and SnAg_OSP solder joints have been generated using high speed cyclic bends test. These could be devolved into a life prediction model for board level solder joints in product drop impact
Keywords :
ageing; bending strength; impact strength; impact testing; production testing; quality assurance; shearing; solders; S-N characteristic; SnAg; SnPb; aging conditions; cyclic bends test; drop impact; drop tests; life prediction model; microimpact characterisation; quality assurance; shear characteristics; solder joint; Aging; Humidity; Inspection; Manufacturing; Quality assurance; Shearing; Soldering; Spraying; Temperature; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2006. Proceedings. 56th
Conference_Location :
San Diego, CA
ISSN :
0569-5503
Print_ISBN :
1-4244-0152-6
Type :
conf
DOI :
10.1109/ECTC.2006.1645627
Filename :
1645627
Link To Document :
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