DocumentCode :
2139236
Title :
Electromagnetic analysis of effective anisotropic material parameters for metal dummies in a CMOS chip
Author :
Hirano, Takuichi ; Okada, Kenichi ; Hirokawa, Jiro ; Ando, Makoto
Author_Institution :
Dept. of Int., Tokyo Inst. of Technol., Tokyo, Japan
fYear :
2012
fDate :
8-14 July 2012
Firstpage :
1
Lastpage :
2
Abstract :
Equivalent anisotropic material parameters for metal dummies in a CMOS chip are extracted using eigenmode analysis for a unit-cell of a space filled with metal dummies. For verification, a space filled with periodically arranged 5 μm × 5 μm aluminum dummy fills with area density of 25 % are numerically simulated. Anisotropic characteristics and higher effective permittivity, of about 20-75 %, are observed.
Keywords :
CMOS integrated circuits; MIMIC; aluminium; eigenvalues and eigenfunctions; electromagnetic fields; permittivity; CMOS chip; aluminum dummy; effective anisotropic material parameters; effective permittivity; eigenmode analysis; electromagnetic analysis; metal dummies; millimeter-wave CMOS RF circuits; unit-cell; Anisotropic magnetoresistance; CMOS integrated circuits; Dielectrics; Metals; Permittivity; Propagation constant; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium (APSURSI), 2012 IEEE
Conference_Location :
Chicago, IL
ISSN :
1522-3965
Print_ISBN :
978-1-4673-0461-0
Type :
conf
DOI :
10.1109/APS.2012.6348496
Filename :
6348496
Link To Document :
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