DocumentCode
2139303
Title
Low conductor loss microstrip lines with side-grooves
Author
Li, K. ; Atsuki, K.
Author_Institution
Univ. of Electro-Commun., Tokyo, Japan
Volume
1
fYear
1996
fDate
17-21 June 1996
Firstpage
311
Abstract
In this paper, we propose two low loss microstrip lines with side-grooves which can weaken the concentration of the current density at the edges of the strip conductor. A method called partial-boundary element method (p-BEM) is employed in our analysis. Theoretical results for these lines demonstrate significant effects on the conductor loss reduction by the side-grooves and inlaid dielectric material.
Keywords
MMIC; boundary-elements methods; integrated circuit interconnections; losses; microstrip circuits; microstrip lines; MMICs; conductor loss; current density; inlaid dielectric material; microstrip lines; partial-boundary element method; side-grooves; strip conductor; Boundary element methods; Conducting materials; Conductors; Current density; Dielectric losses; Dielectric materials; Dielectric substrates; MMICs; Microstrip; Strips;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1996., IEEE MTT-S International
Conference_Location
San Francisco, CA, USA
ISSN
0149-645X
Print_ISBN
0-7803-3246-6
Type
conf
DOI
10.1109/MWSYM.1996.508519
Filename
508519
Link To Document