DocumentCode
2139334
Title
New Algorithm for Extraction of FET Noise Model Parameters
Author
Rudolph, M. ; Doerner, R. ; Klapproth, L. ; Heymann, P.
Author_Institution
Ferdinand-Braun-Institut fÿr Höchstfrequenztechnik, Rudower Chaussee 5, D-12489 Berlin. Phone: +49 30 6392 2644, Fax: +49 30 6392 2642, e-mail: rudolph@fbh-berlin.de
Volume
1
fYear
1998
fDate
Oct. 1998
Firstpage
318
Lastpage
322
Abstract
A new algorithm for extraction of both noise temperatures of the POSPIESZALSKI model is presented. For the first time, they are determined directly from the frequency dependence of the noise factor at a single source impedance (e.g. 50 ¿), without any simplification of the model. This reduces noise measurement efforts considerably. The extraction algorithm is based on linear least-square estimation, and thus yields a unique solution without iteration. Another advantage of the new algorithm is that only the values of the extrinsic elements and the intrinsic resistances Rgs and Rds are to be known a priori.
Keywords
Admittance; Circuit noise; Electronic mail; Frequency dependence; Impedance measurement; Microwave FETs; Noise measurement; Temperature measurement; Thermal resistance; Yield estimation;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 1998. 28th European
Conference_Location
Amsterdam, Netherlands
Type
conf
DOI
10.1109/EUMA.1998.338007
Filename
4139094
Link To Document