Title :
New Algorithm for Extraction of FET Noise Model Parameters
Author :
Rudolph, M. ; Doerner, R. ; Klapproth, L. ; Heymann, P.
Author_Institution :
Ferdinand-Braun-Institut fÿr Höchstfrequenztechnik, Rudower Chaussee 5, D-12489 Berlin. Phone: +49 30 6392 2644, Fax: +49 30 6392 2642, e-mail: rudolph@fbh-berlin.de
Abstract :
A new algorithm for extraction of both noise temperatures of the POSPIESZALSKI model is presented. For the first time, they are determined directly from the frequency dependence of the noise factor at a single source impedance (e.g. 50 ¿), without any simplification of the model. This reduces noise measurement efforts considerably. The extraction algorithm is based on linear least-square estimation, and thus yields a unique solution without iteration. Another advantage of the new algorithm is that only the values of the extrinsic elements and the intrinsic resistances Rgs and Rds are to be known a priori.
Keywords :
Admittance; Circuit noise; Electronic mail; Frequency dependence; Impedance measurement; Microwave FETs; Noise measurement; Temperature measurement; Thermal resistance; Yield estimation;
Conference_Titel :
Microwave Conference, 1998. 28th European
Conference_Location :
Amsterdam, Netherlands
DOI :
10.1109/EUMA.1998.338007
