Title :
Coplanar microwave probe characterization: Caveats and pitfalls
Author :
Arz, Uwe ; Schubert, Dirk
Author_Institution :
On-Wafer Microwave Meas., Phys.-Tech. Bundesanstalt (PTB), Braunschweig, Germany
Abstract :
In this paper, we investigate the wideband microwave properties of standard coplanar microwave probes using popular one- and two-port measurement methods. We illustrate the importance of accurate standard definitions and demonstrate the impact of: the substrate material on the probe characteristics in a frequency range up to 50 GHz.
Keywords :
coplanar waveguides; microwave circuits; coplanar microwave probe characterization; wideband microwave properties; Calibration; Coaxial components; Fixtures; Frequency; Impedance; Manufacturing; Measurement standards; Microwave theory and techniques; Probes; Reflection;
Conference_Titel :
ARFTG Conference, 2006 67th
Conference_Location :
San Francisco, CA
Print_ISBN :
978-0-7803-9529-9
DOI :
10.1109/ARFTG.2006.4734384
