• DocumentCode
    2139494
  • Title

    Coplanar microwave probe characterization: Caveats and pitfalls

  • Author

    Arz, Uwe ; Schubert, Dirk

  • Author_Institution
    On-Wafer Microwave Meas., Phys.-Tech. Bundesanstalt (PTB), Braunschweig, Germany
  • fYear
    2006
  • fDate
    16-16 June 2006
  • Firstpage
    214
  • Lastpage
    218
  • Abstract
    In this paper, we investigate the wideband microwave properties of standard coplanar microwave probes using popular one- and two-port measurement methods. We illustrate the importance of accurate standard definitions and demonstrate the impact of: the substrate material on the probe characteristics in a frequency range up to 50 GHz.
  • Keywords
    coplanar waveguides; microwave circuits; coplanar microwave probe characterization; wideband microwave properties; Calibration; Coaxial components; Fixtures; Frequency; Impedance; Manufacturing; Measurement standards; Microwave theory and techniques; Probes; Reflection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference, 2006 67th
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    978-0-7803-9529-9
  • Type

    conf

  • DOI
    10.1109/ARFTG.2006.4734384
  • Filename
    4734384
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2139494