• DocumentCode
    2139620
  • Title

    Thermal interface material with aligned CNT and its application in HB-LED packaging

  • Author

    Zhang, K. ; Yuen, Matthew M F ; Wang, N. ; Miao, J.Y. ; Xiao, David G W ; Fan, H.B.

  • Author_Institution
    Dept. of Mech. Eng., Hong Kong Univ. of Sci., Kowloon
  • fYear
    0
  • fDate
    0-0 0
  • Abstract
    High density well aligned vertical CNT arrays were synthesized by thermal chemical vapor deposition (CVD) method on 1 inch by 1 inch Si substrates with sputtered Ti and Si layers. They were used as a new kind of thermal interface material (TIM) for the thermal management of microelectronic packages and high brightness light emitting diode (HB-LED) packages. The thermal resistance of the CNT-array-TIM and some other TIM were evaluated and compared according to ASTM D5470 standard. The thermal resistance of CNT-array-TIM was found to be 15 mm2-K/W which was only 20% of that of the commercial silver epoxy. The mechanism of the phonon heat transfer through the CNT-array-TIM was reviewed. The application performance of CNT-array-TIM in HB-LED packages was predicted by finite element analysis using ANSYS code. It was concluded that CNT arrays synthesized by the simple thermal CVD procedure is a promising low cost and effective TIM
  • Keywords
    CVD coatings; carbon nanotubes; electronics packaging; finite element analysis; light emitting diodes; thermal management (packaging); thermal resistance; 1 in; ANSYS code; ASTM D5470 standard; HB-LED packaging; aligned carbon naotube; finite element analysis; light emitting diode; microelectronic packages; phonon heat transfer; thermal chemical vapor deposition; thermal interface material; thermal management; thermal resistance; Brightness; Chemical vapor deposition; Heat transfer; Light emitting diodes; Microelectronics; Packaging; Phonons; Silver; Thermal management; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2006. Proceedings. 56th
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    1-4244-0152-6
  • Type

    conf

  • DOI
    10.1109/ECTC.2006.1645644
  • Filename
    1645644