Title :
An emulation model for sequential ATPG-based bounded model checking
Author :
Qiang, Qiang ; Saab, Daniel G. ; Kocan, Fatih ; Abraham, Jacob A.
Author_Institution :
Dept. of Elec. Engr. & Comp. Sci., Case Western Reserve Univ., Cleveland, OH, USA
Abstract :
Bounded model checking based on sequential ATPG (automatic test pattern generation) is virtually the sequential ATPG state-justification phase. The state-justification phase is a very complicated and expensive process in term of CPU time. Previous work to speed the search concentrated on developing heuristics to achieve speed-up. In this paper we develop a novel architecture to emulate the state-justification on reconfigurable hardware. The feature of fine-grain massive parallelism of reconfigurable hardware is exploited to achieve speed-up.
Keywords :
automatic test pattern generation; computer aided analysis; integrated circuit testing; reconfigurable architectures; CPU time; automatic test pattern generation; bounded model checking; emulation model; fine-grain massive parallelism; reconfigurable hardware; sequential ATPG; state-justification phase; Automatic test pattern generation; Central Processing Unit; Circuit faults; Circuit testing; Emulation; Hardware; Jacobian matrices; Logic arrays; Sequential circuits; Test pattern generators;
Conference_Titel :
Field Programmable Logic and Applications, 2005. International Conference on
Print_ISBN :
0-7803-9362-7
DOI :
10.1109/FPL.2005.1515766