• DocumentCode
    2139837
  • Title

    An emulation model for sequential ATPG-based bounded model checking

  • Author

    Qiang, Qiang ; Saab, Daniel G. ; Kocan, Fatih ; Abraham, Jacob A.

  • Author_Institution
    Dept. of Elec. Engr. & Comp. Sci., Case Western Reserve Univ., Cleveland, OH, USA
  • fYear
    2005
  • fDate
    24-26 Aug. 2005
  • Firstpage
    469
  • Lastpage
    474
  • Abstract
    Bounded model checking based on sequential ATPG (automatic test pattern generation) is virtually the sequential ATPG state-justification phase. The state-justification phase is a very complicated and expensive process in term of CPU time. Previous work to speed the search concentrated on developing heuristics to achieve speed-up. In this paper we develop a novel architecture to emulate the state-justification on reconfigurable hardware. The feature of fine-grain massive parallelism of reconfigurable hardware is exploited to achieve speed-up.
  • Keywords
    automatic test pattern generation; computer aided analysis; integrated circuit testing; reconfigurable architectures; CPU time; automatic test pattern generation; bounded model checking; emulation model; fine-grain massive parallelism; reconfigurable hardware; sequential ATPG; state-justification phase; Automatic test pattern generation; Central Processing Unit; Circuit faults; Circuit testing; Emulation; Hardware; Jacobian matrices; Logic arrays; Sequential circuits; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Field Programmable Logic and Applications, 2005. International Conference on
  • Print_ISBN
    0-7803-9362-7
  • Type

    conf

  • DOI
    10.1109/FPL.2005.1515766
  • Filename
    1515766