Title :
Robust frequency offset estimation for OFDM systems in SFN channel
Author :
Kim, Jung-In ; Im, Se-Bin ; Choi, Hyung-Jin
Author_Institution :
Sch. of Inf. & Commun. Eng., Sungkyunkwan Univ., Suwon, South Korea
Abstract :
In this paper, we propose two robust frequency offset estimation methods for OFDM systems in single frequency network (SFN) with large delay spread. Conventional guard-interval-based (GIB) estimation method is very sensitive to intersymbol interference (ISI) caused by long and strong echoes of the SFN channel. In order to minimize ISI-dependent performance degradation, we first introduce a suboptimal minimum variance unbiased (MVU) estimation method based on best linear unbiased estimation (BLUE) principle, and then we modify it to reduce the computational complexity. Simulation results verify that the proposed methods improve the root mean square error (RMSE) performance without error floor due to ISI in contrast with the conventional method. Also, the reduced-complexity method can achieve suboptimal performance in typical multi-path channel as well as the SFN channel.
Keywords :
OFDM modulation; computational complexity; intersymbol interference; mean square error methods; BLUE principle; GIB estimation method; ISI-dependent performance degradation; MVU estimation method; OFDM systems; RMSE performance; SFN channel; best linear unbiased estimation; computational complexity; error floor; guard-interval-based estimation method; inter-symbol interference; minimum variance unbiased; reduced-complexity method; robust frequency offset estimation methods; root mean square error; single frequency network; Computational modeling; Degradation; Delay estimation; Digital video broadcasting; Fading; Frequency estimation; Intersymbol interference; OFDM; Robustness; Wireless LAN; BLUE; Frequency offset estimation; OFDM; SFN;
Conference_Titel :
Personal, Indoor and Mobile Radio Communications, 2009 IEEE 20th International Symposium on
Conference_Location :
Tokyo
Print_ISBN :
978-1-4244-5122-7
Electronic_ISBN :
978-1-4244-5123-4
DOI :
10.1109/PIMRC.2009.5450303