DocumentCode :
2139921
Title :
Sn-Ag-Cu lead-free composite solders for ultra-fine-pitch wafer-level packaging
Author :
Kumar, K. Mohan ; Kripesh, V. ; Tay, A.A.O.
Author_Institution :
Dept. of Mech. Eng., Nat. Univ. of Singapore
fYear :
0
fDate :
0-0 0
Abstract :
SAC (SAC) based composite solders functionalized with single-wall carbon nanotubes (SWCNTs), nano particles such as nano-Ni, nano-Mo with various weight proportions ranging from 0.01 wt% to 5 wt% were successfully produced The composite solders with different wt% of nano particle and nanotube addition were synthesized using the sintering technique The microstructural, melting and mechanical properties of the SAC-based composite solders were evaluated as a function of different wt% of SWCNT, nano-Ni, and nano-Mo. It is observed that SWCNTs are homogeneously distributed at the edges of Ag3Sn compounds that are distributed evenly in the p-Sn solder matrix. Microstructure analysis revealed that the nano Ni and nano Mo particles were transformed to the intermetallic compounds during processing and distributed uniformly throughout the beta-Sn solder matrix. The different wt% addition of SWCNTs to SAC engendered a higher tensile strength, higher hardness and better melting characteristics. The nano particle reinforced solders are harder and stronger than the unreinforced counterparts. FE-SEM observations of fractured surfaces revealed that the failure is ductile in nature
Keywords :
alloying additions; carbon nanotubes; copper alloys; fine-pitch technology; mechanical properties; nanocomposites; nanoparticles; scanning electron microscopy; silver alloys; sintering; solders; tin alloys; SnAgCu; hardness characteristic; intermetallic compounds; lead-free composite solders; mechanical property; melting characteristi; melting property; microstructure analysis; nanoparticle reinforced solders; single-wall carbon nanotubes; sintering technique; tensile strength; ultra-fine-pitch packaging; wafer-level packaging; Carbon nanotubes; Environmentally friendly manufacturing techniques; Lead; Legislation; Mechanical engineering; Mechanical factors; Microelectronics; Nickel; Powders; Wafer scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2006. Proceedings. 56th
Conference_Location :
San Diego, CA
ISSN :
0569-5503
Print_ISBN :
1-4244-0152-6
Type :
conf
DOI :
10.1109/ECTC.2006.1645653
Filename :
1645653
Link To Document :
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